Characterization of surfaces
In "scanning probe" microscopes, samples and samples form a unique system.
What physical and mechanical properties of the sample are necessary to ensure that the properties of the probe do not affect the results?
What is the "thickness" of the free surface of the material in the solid state? Is there a difference between physical thickness, which reflects electronic structure, and chemical thickness, which reflects variation in composition?
Analytical information can be obtained from a series of signals. What properties of photoelectrons, Auger electrons, and secondary ions make them suitable for surface analysis?